8XBregularity(Light and dark field)Chip inspection microscope
■application
regularity(Light and dark field)Chip inspection microscopes are widely used for transparent, semi transparent or opaque substances, such as metal ceramics, electronic chips, printed circuits, etcLCDThe structure and traces on the surface of substrates, films, fibers, granular objects, coatings, and other materials can all have good imaging effects.

■Technical specifications of microscope
1.Tube:30°incline
2.High eye point eyepiece:WF10X/Φ25mm
3.Infinite long working distance bright and dark field objective lens:5×/0.1B. D/W.D.29.4mm
10×/0.25B. D/W.D.16mm
20×/0.40B. D/W.D.10.6mm
40×/0.60B. D/W.D.5.4mm(Purchase)
50×/0.55B. D/W.D.5.1mm
100×(Dry)/0.80B. D/W.D.3mm(Purchase)
4.Converter: Five hole
5.Workbench size:311mm*352mm, moving range:250mm×250mm
6.Focusing: Coarse micro coaxial, range36mmMicro motion0.002mm
7.Light source: Vertical illumination, with aperture light bar and field of view light bar, halogen lamp12V/100W，AC85V-230VAdjustable brightness
8.DICDevice: Polarization device, light dark field conversion
■Instrument completeness
1.Microscope body:1tower
2.Eyepiece tube:1only
3.10XEyepiece:1answer
4.Infinite long working distance bright dark field objective lens5X、10X、20X、50X:every1only
5.Random file:1cover
■Optional parts
1.Eyepiece:12.5XEyepiece;10XMicrometer mirror, micrometer ruler(Grid value:0.01mm)
2.Infinite long working distance bright and dark field objective lens:40X、100X(shield)

Original old station parameter address: http://www.sgaaa.com/cp/jinxiangxianweijing-8XB.htm